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Volumn 60, Issue 10, 2000, Pages 397-401

Workplace exposure profiles (WEP) - A novel method for assessment of short time exposure in workplaces;Arbeitsplatzexpositionsprofile (AEP) - Ein neues werkzeug zur beurteilung von kurzzeitexpositionen an arbeitsplatzen

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL AGENT; NITROGEN OXIDE;

EID: 0033626364     PISSN: 09498036     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (2)

References (4)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.