Mid-infrared silicon/germanium focal plane detector arrays

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3630, Issue , 1999, Pages 73-89

  Presting, Hartmut ^a   Konle, Johannes ^a   Hepp, Markus ^a   Kibbel, Horst ^a   Thonke, Klaus ^a   Sauer, Rolf ^a   Cabanski, Wolfgang ^a   Jaros, Milan ^a  

^a DAIMLER AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; MOLECULAR BEAM EPITAXY; PHOTOCURRENTS; PHOTOEMISSION; QUANTUM EFFICIENCY; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING; SEMICONDUCTOR QUANTUM WELLS; X RAY DIFFRACTION;

ABSORPTION MEASUREMENTS; FOCAL PLANE ARRAYS; HETERO-INTERNAL PHOTOEMISSION; PHOTORESPONSE; SINGLE MESA DETECTORS;

INFRARED DETECTORS;

EID: 0033608012     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.342804     Document Type: Conference Paper

References (8)