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Moore, C.E.1
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85034561578
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note
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ZFIT program, Nonlinear Least Squares Analysis of Fluorescence Decay Data, M. Rehorek, H. Otto, W. Rettig, and A. Klock, and modified by P. Gürtler and M. Joppien, last update August 1995.
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0000070078
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1/2)/(1 - r)), in which r=exp(-θ) and p is the phonon number. Equation (1) is the first term in the expansion of the Wp function, and at low temperatures it approximates the latter very well. The line shape generated with the Wp function, using the S and ℏω terms extracted for the 329 nm emission band recorded at 4.3 K in the Cd/Xe system, was identical to that generated with Eq. (1). The advantage of using Eq. (1) over the Wp function is that it avoids use of the modified Bessel function Ip(x) appearing in the Wp expression, which makes fitting to this formula difficult and unreliable. For a more detailed discussion of these functions, see C. W. Struck and W. H. Fonger, Understanding Luminescence Spectra and Efficiency Using Wp and Related Functions (Springer-Verlag, Berlin, 1991). Chap. 4.
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Rhys. Proc. R. Soc. London, Ser. A
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Huang, K.1
Rhys, A.2
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18
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0004114934
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Springer-Verlag, Berlin, Chap. 4
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1/2)/(1 - r)), in which r=exp(-θ) and p is the phonon number. Equation (1) is the first term in the expansion of the Wp function, and at low temperatures it approximates the latter very well. The line shape generated with the Wp function, using the S and ℏω terms extracted for the 329 nm emission band recorded at 4.3 K in the Cd/Xe system, was identical to that generated with Eq. (1). The advantage of using Eq. (1) over the Wp function is that it avoids use of the modified Bessel function Ip(x) appearing in the Wp expression, which makes fitting to this formula difficult and unreliable. For a more detailed discussion of these functions, see C. W. Struck and W. H. Fonger, Understanding Luminescence Spectra and Efficiency Using Wp and Related Functions (Springer-Verlag, Berlin, 1991). Chap. 4.
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Understanding Luminescence Spectra and Efficiency Using Wp and Related Functions
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Struck, C.W.1
Fonger, W.H.2
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20
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85034543387
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note
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m.
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23
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25744472063
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unpublished results
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The index of refraction of Ar at 233 nm is 1.32 at 6 K. Those of Kr at 241 and 262 nm are 1.428 and 1,418, respectively (P. Gürtler, unpublished results, 1996).
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(1996)
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Gürtler, P.1
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25
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33751158073
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C. Crepin, M. Chergui, T. Herbert, L. Koenig, P. Martin, and A. Tramer, J. Phys. Chem. 98, 3280 (1994).
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Tramer, A.6
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26
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0031560006
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V. A. Bracken, P. N. Kerins, P. Gürtler, and J. G. McCaffrey, J. Chem. Phys. 107, 5300 (1997).
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J. Chem. Phys.
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Bracken, V.A.1
Kerins, P.N.2
Gürtler, P.3
McCaffrey, J.G.4
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27
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0346821780
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unpublished results
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-1 intervenes between the two minima. B. Healy and J. G. McCaffrey, unpublished results, 1998.
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(1998)
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Healy, B.1
McCaffrey, J.G.2
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