Capacitance transient spectroscopy in metal-insulator-metal systems and its application to the determination of trap parameters in polyimide films

Journal of Applied Physics

Volumn 85, Issue 2, 1999, Pages 1089-1094

  Liufu, D ^a   Kao, K C ^a  

^a UNIVERSITY OF MANITOBA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELECTRIC INSULATING MATERIALS; ELECTRIC POTENTIAL; ELECTRON TRAPS; ELECTRON TUNNELING; MIM DEVICES; PLASTIC FILMS; POLYIMIDES; TEMPERATURE;

ELECTRON INJECTION; POLYIMIDE FILM;

DEEP LEVEL TRANSIENT SPECTROSCOPY;

EID: 0033555052     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369233     Document Type: Article

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