Growth and microstructure of Si/CaF2/Si(111) heterostructures

Thin Solid Films

Volumn 339, Issue 1-2, 1999, Pages 51-57

  Gribelyuk, M A ^a,b   Wilk, G D ^a  

^a TEXAS INSTRUMENTS   (United States)

^b IBM   (United States)

Author keywords

Heterostructures; High resolution transmission electron microscopy; Microstructure

Indexed keywords

CALCIUM COMPOUNDS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGING TECHNIQUES; MOLECULAR BEAM EPITAXY; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR GROWTH; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM);

HETEROJUNCTIONS;

EID: 0033534927     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01078-5     Document Type: Article

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