Plasma-nitrided AISI-316 stainless steel examined by scanning electron microscopy and secondary ion mass spectrometry

Thin Solid Films

Volumn 345, Issue 1, 1999, Pages 108-112

  Baldwin, M J ^a   Kumar, S ^a   Priest, J M ^a   Fewell, M P ^a   Prince, K E ^b   Short, K T ^b  

^a UNIVERSITY OF NEW ENGLAND   (Australia)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; INTERFACES (MATERIALS); NITRIDING; PLASMA APPLICATIONS; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SPUTTER DEPOSITION; SURFACE TREATMENT; THICKNESS MEASUREMENT;

LOW PRESSURE RADIOFREQUENCY PLASMA; NITROGEN CONCENTRATION; PLASMA NITRIDED STAINLESS STEEL; SPUTTER RATE; TREATED SURFACE LAYER;

STAINLESS STEEL;

EID: 0033531817     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00066-8     Document Type: Article

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