Current-induced switching of domains in magnetic multilayer devices

Science

Volumn 285, Issue 5429, 1999, Pages 867-870

  Myers, E B ^a   Ralph, D C ^a   Katine, J A ^b   Louie, R N ^b   Buhrman, R A ^b  

^a Laboratory of Atomic and Solid State Physics and Sibley School of Mechanical and Aerospace Engineering   (United States)

^b Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; COPPER; ELECTRIC CURRENTS; INTERFACES (MATERIALS); MAGNETIC DOMAINS; MAGNETIC MOMENTS; METALLIC FILMS; MULTILAYERS;

MAGNETIC MULTILAYER DEVICES;

MAGNETIC THIN FILM DEVICES;

COBALT; COPPER;

ARTICLE; DEVICE; ELECTRON TRANSPORT; MAGNETISM; PRIORITY JOURNAL;

EID: 0033529526     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.285.5429.867     Document Type: Article

References (16)

1. For reviews of the science and applications of GMR materials, see the collection of articles in IBM J. Res. Dev. 42, (January 1998). (available electronically at www.research.ibm.com/journal/rd42-1.html)
2. J. Slonczewski, J. Magn. Magn. Mater. 159, L1 (1996).
3. L. Berger, Phys. Rev. B 54, 9353 (1996).
4. Ya. B. Bazaliy, B. A. Jones, S.-C. Zhang, ibid. 57, R3213 (1998).
5. J. Slonczewski, J. Magn. Magn. Mater. 195, L261 (1999).
6. R. N. Louie, thesis, Cornell University, Ithaca, NY (1997).
7. M. Tsoi et al., Phys. Rev. Lett. 80, 4281 (1998); erratum, ibid. 81, 493 (1998).
8. M. Tsoi et al., Phys. Rev. Lett. 80, 4281 (1998); erratum, ibid. 81, 493 (1998).
9. J.-E. Wegrowe et al., Europhys. Lett. 45, 626 (1999).
10. J. Z. Sun, J. Magn. Magn. Mater. 202, 157 (1999).
11. K. S. Ralls, R. A. Buhrman, R. C. Tiberio, Appl. Phys. Lett. 55, 2459 (1989).
12. A. G. M. Jansen, A. P. van Gelder, P. Wyder, J. Phys. C 13, 6073 (1980).
13. Fig. 2, B through E, exhibits samples never exposed to a magnetic field, but there are no qualitative differences as a function of magnetic history, as long as H = 0.
14. For a review, see M. A. M. Gijs and G. E. W. Bauer, Adv. Phys. 46, 285 (1997).
15. Point-contact measurements of Cu/Co multilayers have previously shown small GMR values; see (6) and M. V. Tsoi, A. G. M. Jansen, J. Bass, J. Appl. Phys. 81, 5530 (1997).
16. We thank J. Slonczewski, S. Guéron, and R. H. Silsbee for discussions. The work was supported by the NSF Materials Research Science and Engineering Centers program (DMR-9632275), the Sloan and Packard Foundations, the Office of Naval Research (N00014-97-1-0745), and Defense Advanced Research Projects Agency, and was performed in part at the Cornell node of the National Nanofabrication Users Network, supported by the NSF. E.B.M. was supported by a U.S. Department of Education grant.