Electro-optical characterization of h-BN thin film waveguides by prism coupling technique

Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 59, Issue 1-3, 1999, Pages 244-247

  Boudiombo, J ^a   Loulergue, J C ^a   Bath, A ^a   Thevenin, P ^a  

^a UNIVERSITÉ DE LORRAINE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BORON COMPOUNDS; ELECTRODES; ELECTROOPTICAL EFFECTS; OPTICAL PROPERTIES; OPTICAL VARIABLES MEASUREMENT; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; REFRACTIVE INDEX; SPECTROSCOPY; THIN FILMS;

BORON NITRIDE; COPLANAR ELECTRODES; ELECTROOPTIC TENSOR; PRISM COUPLING TECHNIQUE;

WAVEGUIDES;

EID: 0033528946     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(98)00375-4     Document Type: Article

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