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Volumn 32, Issue 44, 1999, Pages
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Precise critical exponents for the basic contact process
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0033527506
PISSN: 03054470
EISSN: None
Source Type: Journal
DOI: 10.1088/0305-4470/32/44/102 Document Type: Article |
Times cited : (23)
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References (40)
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