A simple method for ohmic loss in conductors with cross-section dimensions on the order of skin depth

Microwave and Optical Technology Letters

Volumn 20, Issue 5, 1999, Pages 302-304

  Chow, Y L ^a   Feng, N N ^a   Fang, D G ^a  

^a NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

D line; Impedance boundary condition; Ohmic loss; Synthetic asymptote method

Indexed keywords

ALGORITHMS; ASYMPTOTIC STABILITY; BOUNDARY VALUE PROBLEMS; ELECTRIC CONDUCTORS; ELECTRIC IMPEDANCE; ELECTRIC LOSSES; SKIN EFFECT;

DC ASYMPTOTE; HF ASYMPTOTE; IMPEDANCE BOUNDARY CONDITION; OHMIC LOSS;

MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;

EID: 0033525303     PISSN: 08952477     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1098-2760(19990305)20:5<302::AID-MOP6>3.0.CO;2-T     Document Type: Article

References (8)

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