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Journal of Molecular Structure

Volumn 480-481, Issue , 1999, Pages 169-178

Waveguide Raman spectroscopy: A non-destructive tool for the characterization of amorphous thin films

(7) Duverger, C a Nedelec, J M a Benatsou, M b Bouazaoui, M b Capoen, B b Ferrari, M c Turrell, S a

a UNIVERSITÉ DES SCIENCES ET TECHNOLOGIES DE LILLE (France)

b UNIVERSITÉ DES SCIENCES ET TECHNOLOGIES DE LILLE (France)

c CNR (Italy)

Author keywords

Alumino silicate glass; Germano silicate glass; Optical waveguide; Sol gel method; Waveguide Raman spectroscopy

Indexed keywords

SILICATE; SILICON DIOXIDE;

CONFERENCE PAPER; CRYSTALLIZATION; FILM; RAMAN SPECTROMETRY; TEMPERATURE;

EID: 0033522580 PISSN: 00222860 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-2860(98)00694-2 Document Type: Conference Paper

Times cited : (24)

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