Portable holographic interferometer for residual stress measurement and nondestructive testing (NDT) of the pipelines

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3588, Issue , 1999, Pages 16-24

  Onishchenko, Yuriy ^a   Kniazkov, Anatoli ^a   Shulz, Jon ^a   Salamo, Gregory J ^a  

^a UNIVERSITY OF ARKANSAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MECHANICAL VARIABLES MEASUREMENT; NONDESTRUCTIVE EXAMINATION; PIPELINES; RESIDUAL STRESSES; SURFACE STRUCTURE;

PORTABLE HOLOGRAPHIC INTERFEROMETER; RESIDUAL STRESS MEASUREMENT; SCRATCH;

HOLOGRAPHIC INTERFEROMETRY;

EID: 0033522104     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (11)