Pattern formation in semiconductors

Nature

Volumn 397, Issue 6718, 1999, Pages

  Bel'kov, V V ^a   Hirschinger, J ^a   Novak V ^b   Niedernostheide, F J ^a   Ganichev, S D ^a   Prettl, W ^a  

^a UNIVERSITY OF REGENSBURG   (Germany)

^b A S   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELECTRIC CONTACTS; ELECTRIC FIELDS; ELECTRON SCATTERING; IMPACT IONIZATION; PHOTOLUMINESCENCE; SEMICONDUCTOR MATERIALS;

ELECTRON HOLE DROPS; FREE CARRIER DENSITY; PATTERN FORMATION; RECOMBINATION PROCESSES;

CHARGE CARRIERS;

ELECTRIC FIELD; ELECTRON TRANSPORT; LETTER; MICROWAVE RADIATION; PRIORITY JOURNAL; QUANTUM MECHANICS; SEMICONDUCTOR;

EID: 0033521943     PISSN: 00280836     EISSN: None     Source Type: Journal    
DOI: 10.1038/17040     Document Type: Article

References (7)

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5. Jeffries, C. D. Science 189, 955-964 (1975).
6. Eberle, W. et al. Appl. Phys. Lett. 68, 3329-3331 (1996).
7. Levinson, I. B. Sov. Phys. Solid State 7, 1098-1102 (1965).