Influence of optical interference on quantum well infrared photodetectors in a 45° waveguide geometry

Applied Physics Letters

Volumn 74, Issue 1, 1999, Pages 16-18

  Schneider, H ^a   Schonbein C ^a   Walther, M ^a   Koidl, P ^a   Weimann, G ^a  

^a FRAUNHOFER INSTITUTE FOR APPLIED SOLID STATE PHYSICS IAF   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DENSITY (OPTICAL); ELECTRIC CONDUCTIVITY; ELECTRIC EXCITATION; ELECTRIC FIELDS; ELECTRIC POTENTIAL; INFRARED RADIATION; LIGHT REFLECTION; PHASE SHIFT; PHOTOCURRENTS; PHOTODETECTORS; SEMICONDUCTOR QUANTUM WELLS;

OPTICAL EXCITATION DENSITY; PHOTORESPONSE; QUANTUM WELL INFRARED PHOTODETECTORS;

LIGHT INTERFERENCE;

EID: 0033521313     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123119     Document Type: Article

References (17)

1. W. A. Beck, J. W. Little, A. C. Goldberg, and T. S. Faska, NATO ASI Series Vol. E 270, Quantum Well Intersubband Transition Physics and Devices, edited by H. C. Liu, B. F. Levine, and J. Y. Andersson (Kluwer, Dordrecht, 1994), p. 55;
2. S. Gunapala, J. K. Liu, J. S. Park, M. Sundaram, C. A. Shott, T. Hoelter, T.-L. Lin, S. T. Massie, P. D. Maker, R. E. Muller, and G. Sarusi, IEEE Trans. Electron Devices 44, 51 (1997).
3. R. Breiter, W. Cabanski, K. H. Mauk, W. Rode, J. Ziegler, K. Eberhardt, and R. Oelmaier, Proc. SPIE 3379, 344 (1998);
4. M. Walther, F. Fuchs, H. Schneider, J. Schmitz, W. Pletschen, J. Braunstein, J. Ziegler, W. Cabanski, P. Koidl, and G. Weimann, Proc. SPIE 3436, 348 (1998).
5. B. Levine, J. Appl. Phys. 74, R1 (1993).
6. R. W. Ditchburn, Light (Academic, London, 1976), p. 521ff.
7. V. D. Shadrin, V. V. Mitin, K. K. Choi, and V. A. Kochelap, J. Appl. Phys. 78, 5765 (1995).
8. M. Ershov, Appl. Phys. Lett. 72, 2865 (1998).
9. H. C. Liu, Z. R. Wasilewski, and M. Buchanan, Appl. Phys. Lett. 63, 761 (1993).
10. C. Mermelstein, H. Schneider, A. Sa'ar, C. Schönbein, M. Walther, and G. Bihlmann, Appl. Phys. Lett. 71, 2011 (1997).
11. H. Schneider, C. Mermelstein, R. Rehm, C. Schönbein, A. Sa'ar, and M. Walther, Phys. Rev. B 57, R15096 (1998).
12. A. Yamashita and R. Nii, Jpn. J. Appl. Phys. 5, 263 (1966).
13. K. K. Choi, B. F. Levine, R. J. Malik, J. Walker, and C. G. Bethea, Phys. Rev. B 35, 4172 (1987);
14. H. T. Grahn, H. Schneider, and K. v. Klitzing, Appl. Phys. Lett. 54, 1757 (1989).
15. J. Y. Duboz, E. Costard, J. Nagle, J. M Berset, J. M. Ortega, and J. M. Gerard, J. Appl. Phys. 78, 1224 (1995).
16. M. Ershov, H. C. Liu, M. Buchanan, Z. R. Wasilewski, and V. Ryzhii, Appl. Phys. Lett. 70, 414 (1997).
17. M. J. Kane, M. T. Emeny, N. Apsley, C. R. Whitehouse, and D. Lee, Semicond. Sci. Technol. 3, 722 (1988).