Non-contact characterization of static paper materials using a photorefractive interferometer

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3589, Issue , 1999, Pages 30-41

  Lafond, Emmanuel F ^a   Gerhardstein, Joe P ^a   Brodeur, Pierre H ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CRYSTALS; ELECTRIC FIELDS; NEODYMIUM LASERS; NONDESTRUCTIVE EXAMINATION; ONLINE SYSTEMS; PAPER; PHOTOREFRACTIVE MATERIALS; PROCESS CONTROL; SIGNAL TO NOISE RATIO; STIFFNESS; ULTRASONIC WAVES;

BISMUTH SILICON OXIDE; LASER BASED ULTRASOUND SYSTEM; PAPER WEB; PHOTOREFRACTIVE INTERFEROMETER; TWO WAVE MIXING;

INTERFEROMETERS;

EID: 0033518788     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (29)