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Volumn 157, Issue 1-4, 1999, Pages 214-219
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Energy- and angle-dependent trends in the trapping probability of O+ incident on Cu(001)
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMS;
AUGER ELECTRON SPECTROSCOPY;
ELECTRON SCATTERING;
IONS;
SURFACE STRUCTURE;
SURFACES;
ION SURFACE IMPACT;
ION TRAPPING;
METAL SURFACES;
TRAPPING PROBABILITY;
ELECTRON TRAPS;
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EID: 0033516783
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(99)00413-9 Document Type: Article |
Times cited : (2)
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References (20)
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