Monte Carlo simulation of slow-electron cascade in potential electron emission

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 153, Issue 1-4, 1999, Pages 47-51

  Nishimura, K ^a   Ohya, K ^b  

^a NUMAZU COLLEGE OF TECHNOLOGY   (Japan)

^b UNIVERSITY OF TOKUSHIMA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; AUGER ELECTRON SPECTROSCOPY; COMPUTER SIMULATION; ELECTRON ENERGY LEVELS; HELIUM; IONIZATION; IONS; KINETIC ENERGY; MONTE CARLO METHODS;

AUGER NEUTRALIZATION; ELECTRON CASCADE; ELECTRON EXCITATION; EXCITATION DEPTH; ION SOLID INTERACTION; IONIZATION ENERGY;

ELECTRON EMISSION;

EID: 0033516111     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00035-X     Document Type: Article

References (7)

1. Hagstrum H.D. Phys. Rev. 96:1954;336.
2. Ohya K., Kawata J. Scan. Microsc. 9:1995;331.
3. R. Baragiola et al., Surf. Sci. 90 (1979) 240.
4. G. Lakits et al., Phys. Rev. A 42 (1990) 5780.
5. K. Töglhofer et al., Surf. Sci. 281 (1993)143.
6. H.D. Hagstrum and D'Amico, J. Appl. Phys. 31 (1960) 715.
7. R. Marrus, Physics of Highly-Ionized Atoms, Plenum Press, New York, 1990.