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Volumn 150, Issue 1-4, 1999, Pages 356-362
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High sensitivity elemental analysis methodology for upper tropospheric aerosol
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Author keywords
[No Author keywords available]
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Indexed keywords
ATMOSPHERIC AEROSOLS;
CHARGED PARTICLES;
MICROSCOPIC EXAMINATION;
PARTICLES (PARTICULATE MATTER);
SULFUR;
ELEMENTAL ANALYSIS;
IMPACTION;
PARTICLE INDUCED X RAY EMISSIONS;
SCANNING TRANSMISSION ION MICROSCOPY;
UPPER TROPOSPHERE;
X RAY ANALYSIS;
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EID: 0033515171
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(98)01082-9 Document Type: Article |
Times cited : (16)
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References (8)
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