X-ray diffraction analysis of melt-grown ZnGeP2 (ZGP)

Journal of Crystal Growth

Volumn 198-199, Issue PART I, 1999, Pages 583-587

  Shimony, Y ^a   Kimmel, G ^b   Raz, O ^c   Dariel, M P ^c  

^a ROTEM INDUSTRIES LTD   (Israel)

^b NUCLEAR RESEARCH CENTER NEGEV   (Israel)

^c BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

Crystal growth; Rietveld analysis; XRD; Zinc germanium phosphide

Indexed keywords

ABSORPTION; ANNEALING; NONLINEAR OPTICS; OPTICAL MATERIALS; POINT DEFECTS; SINGLE CRYSTALS; THERMAL EXPANSION; X RAY CRYSTALLOGRAPHY; ZINC COMPOUNDS;

HORIZONTAL GRADIENT FREEZING (HGF) TECHNIQUE; LINE PROFILE FITTING (LPE) ANALYSIS; ZINC GERMANIUM PHOSPHIDE;

CRYSTAL GROWTH FROM MELT;

EID: 0033514695     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(98)01232-9     Document Type: Article

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