Formation of unknown magnetic phase by solid state reaction of thin multilayered films of 75 at% Mn-25 at%Ge

Journal of Magnetism and Magnetic Materials

Volumn 192, Issue 2, 1999, Pages 247-252

  Matsui, T ^a   Shigematsu, M ^a   Mino, S ^b   Tsuda, H ^a   Mabuchi, H ^a   Morii, K ^a  

^a Osaka Prefecture University   (Japan)

^b HITACHI CABLE LTD   (Japan)

Author keywords

75.50. i; 75.50.Cc; Crystal structure characterization; Magnetic properties; Mn Ge system; Multilayered film; Solid state phase formation

Indexed keywords

ANNEALING; CRYSTAL LATTICES; ELECTRON DIFFRACTION; FERROMAGNETISM; GERMANIUM; HIGH TEMPERATURE PROPERTIES; LATTICE CONSTANTS; MAGNETIZATION; MANGANESE; MULTILAYERS; THIN FILMS;

SOLID-STATE PHASE FORMATION;

MAGNETIC FILMS;

EID: 0033514226     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(98)00531-9     Document Type: Article

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