Toward Controlled Area Electrode Assemblies: Selective Blocking of Gold Electrode Defects with Polymethylene Nanocrystals

Langmuir

Volumn 15, Issue 3, 1999, Pages 742-748

  Seshadri, Kannan ^a   Wilson, Ann M ^b   Guiseppi Elie, Anthony ^b   Allara, David L ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b Research and Development Department   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMISORPTION; CONDUCTIVE PLASTICS; CRYSTAL DEFECTS; CRYSTAL MICROSTRUCTURE; DIELECTRIC FILMS; ELECTROPOLYMERIZATION; GOLD; NANOSTRUCTURED MATERIALS; NUCLEATION; ORGANIC POLYMERS; PLASTIC FILMS; SPUTTER DEPOSITION;

ALKANETHIOLATE; DIAZOMETHANE; POLYANILINE; POLYMETHYLENE;

ELECTROCHEMICAL ELECTRODES;

EID: 0033514210     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la980063j     Document Type: Article

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58. Note that the contact angle hysteresis for PM/(sputtered Au) is consistently higher by as much as 30° than for PM/(evaporated Au), as expected from the increased surface roughness for the former.
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62. However, note that the intensities of the progression bands appear to increase with increasing PM coverage (Figure 7a), in contrast to the decrease of the C - O stretching peak. The source of this contrary effect is not clear but may be due to chain orientation effects. Since the transition moment of the progression series is parallel to the chain axis, this would imply a more vertical alignment of the alkanethiolate chains as the PM pore sizes decrease.
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