Network Formation in Nanoparticulate Tin Oxide-Gelatin Thin Films

Langmuir

Volumn 15, Issue 3, 1999, Pages 654-661

  Texter, John ^a,b   Lelental, Mark ^a  

^a EASTMAN KODAK COMPANY   (United States)

^b Strider Research Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC LOSSES; DRYING; ELECTRIC RESISTANCE MEASUREMENT; ELECTRONICS PACKAGING; ELECTROSTATICS; NANOSTRUCTURED MATERIALS; PERCOLATION (SOLID STATE); PROTEINS; RELAXATION PROCESSES; SURFACE PROPERTIES; THIN FILMS; TIN COMPOUNDS;

ELECTROSTATIC CHARGING; GELATIN; SURFACE ELECTRICAL RESISTANCE (SER); TIN OXIDE;

CONDUCTIVE FILMS;

EID: 0033514190     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la980526l     Document Type: Article

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