메뉴 건너뛰기




Volumn 197, Issue 3, 1999, Pages 655-658

The use of semiconductor scintillation crystals AIIBVI in radiation instruments

Author keywords

Dosimetry; Introscopy; Isovalent doping; Light out; Scintillation crystals AIIBVI; Spectrometry; Time decay

Indexed keywords

DOSIMETRY; RADIATION DETECTORS; SCINTILLATION COUNTERS; SEMICONDUCTOR COUNTERS; SPECTROMETRY;

EID: 0033514136     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(98)00771-4     Document Type: Article
Times cited : (20)

References (6)
  • 6
    • 0006102385 scopus 로고    scopus 로고
    • Neutrons flux measurement using "SC = PD-PA" system and new type of SC
    • Greece, 9-15 June SPIE-Int. Soc. Ont. Eng.
    • V. Ryzhikov S. Burachas, V. Svishch, et al., Neutrons flux measurement using "SC = PD-PA" system and new type of SC, in: Proc. Int. Conf. on Neutrons in Research and Industry, vol. 2867, Greece, 9-15 June 1996, SPIE-Int. Soc. Ont. Eng., pp. 586-595.
    • (1996) Proc. Int. Conf. on Neutrons in Research and Industry , vol.2867 , pp. 586-595
    • Ryzhikov, V.1    Burachas, S.2    Svishch, V.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.