Si nanocrystals formed by electron-induced SiO2 decomposition as applied to atomic-resolved observation of the nanocrystal surfaces

Journal of Electron Microscopy

Volumn 48, Issue SUPPL., 1999, Pages 1087-1091

  Takeguchi, M ^a   Furuya, K ^a   Yoshihara, K ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Dimer; Electron stimulated desorption; Nanoparticle; Si nanocrystal; Si 001 surface; Si 113 surface; UHV FE TEM

Indexed keywords

EID: 0033495782     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (13)