Particle shape and structure analysis from the spatial intensity pattern of scattered light using different measuring devices

Journal of Aerosol Science

Volumn 30, Issue 10, 1999, Pages 1257-1270

  Sachweh, Bernd ^a   Barthel, Holger ^a   Polke, Reinhard ^a   Umhauer, Heinz ^b   Büttner, Helmut ^c  

^a BASF SE   (Germany)

^b UNIVERSITY OF KARLSRUHE   (Germany)

^c Rheinland Pfälzische Technische Universität Kaiserslautern Landau   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; LIGHT SCATTERING; PARTICLE SIZE ANALYSIS; PARTICLES (PARTICULATE MATTER); SURFACE STRUCTURE;

DISCRETE DIPOLE APPROXIMATION; ELONGATED PARTICLES; SINGLE GASBORNE PARTICLES; SPATIAL INTENSITY PATTERN; SUPERMICRON PARTICLES;

AEROSOLS;

ACCURACY; AEROSOL; INSTRUMENT; LIGHT SCATTERING; MATHEMATICAL ANALYSIS; NEPHELOMETRY; PARTICLE SIZE; PRIORITY JOURNAL; SHORT SURVEY; TECHNIQUE; THEORY;

EID: 0033486467     PISSN: 00218502     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0021-8502(99)00045-2     Document Type: Article

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