Precision measurements of the line profile by the diode laser spectroscopic method

Quantum Electronics

Volumn 29, Issue 10, 1999, Pages 916-920

  Nadezhdinskii A I ^a   Ponurovskii Ya Ya ^a   Spiridonov, M V ^a  

^a PROKHOROV GENERAL PHYSICS INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033478820     PISSN: 10637818     EISSN: None     Source Type: Journal    
DOI: 10.1070/QE1999v029n10ABEH001603     Document Type: Article

References (7)

1. Duraev V P et al. Proceedings of the Second International Conference on Tunable Diode Laser Spectroscopy, Moscow, 1998, p. 22
2. Keppler K A, Mellau G C, et al. J. Mol. Spectrosc. 175 411 (1996)
3. Nadezhdinskii A I Spectrochim. Acta A 52 959 (1996)
4. Nadezhdinskii A I Spectrochim. Acta A 52 1041 (1996)
5. Moskalenko K V, Sobolev N N, et al. Proc. SPIE Int. Soc. Opt. Eng. 2205 400 (1993)
6. Avetisov V G, Nadezhdinskii A I, et al. J. Quantum Spectrosc. Radiat. Transfer 49 417 (1993)
7. Amann M C, Buus J Tunable Laser Diodes (Bolston: Artech House, 1998)