An improved goodness of fit statistic for probability prediction models

Biometrical Journal

Volumn 41, Issue 1, 1999, Pages 71-82

  Pigeon, Joseph G ^a   Heyse, Joseph F ^b  

^a VILLANOVA UNIVERSITY   (United States)

^b MERCK RESEARCH LABORATORIES   (United States)

Author keywords

Goodness of fit; Logistic regression; Polychotomous regression; Probability prediction models

Indexed keywords

FORECASTING; REGRESSION ANALYSIS; STATISTICAL TESTS;

GOODNESS OF FIT; GOODNESS-OF-FIT STATISTICS; LOGISTIC REGRESSION MODELING; LOGISTICS REGRESSIONS; NULL HYPOTHESIS; POLYCHOTOMOUS REGRESSION; PREDICTION MODELLING; PROBABILITY PREDICTION MODEL; REGRESSION MODELLING; SIMULATION STUDIES;

STATISTICS;

EID: 0033475934     PISSN: 03233847     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-4036(199903)41:1<71::AID-BIMJ71>3.0.CO;2-O     Document Type: Article

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