Structure of [Cu(phen)2]2[{Cu(phen)}2Mo8O 26]·H2O

Polish Journal of Chemistry

Volumn 73, Issue 11, 1999, Pages 1909-1916

  Wang, R Z ^a   Xu, J Q ^a   Yang, G Y ^a   Bu, W M ^b   Xing, Y H ^a   Li, D M ^a   Liu, S Q ^a   Ye, L ^b   Fan, Y G ^b  

^a JILIN UNIVERSITY   (China)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033473668     PISSN: 01375083     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (11)

1. Xu X.X., You X.Z and Wang X., Polyhedron., 13, 1011 (1994).
2. Fuchs I. and Hartl H., Angew. Chem. Int. Ed. Engl., 15, 375 ( 1976).
3. Weakley J.J.R, Polyhedron, 1, 17 (1982).
4. Niven M.L., Cruywagen J.J. and Heyns J.B.B., J. Chem. Soc. Dalton. Trans., 2007 (1991).
5. Hagraman D., Zubieta C., Rose D.J., Zubieta J. and Haushalter R.C., Angew. Chem. Int. Ed. Engl., 36, 873 (1997).
6. Klemperer W.G. and Shum W., J. Am. Chem. Soc., 98 (25), 8291 (1976).
7. Siemens (1994a) P4 Diffractometer control program, Version 2.1. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
8. Siemens (1994b) XSCANS. X-ray single Crystal Analysis System Version 2.1. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA (1994).
9. Sheldrick G.M., Acta. Cryst., A46, 467 (1990).
10. Sheldrick G.M., SHELXL 93., Program for the Refinement of Crystal Structure, University of Göttingen, Germany (1993).
11. Sheldrick G.M., SHELXTL, Version 5. Siemens Analytical X-ray Instrument Inc., Madison, Wisconsin, USA.