Ferromagnetic resonance of Co 100-xHf x: Thin films

Journal of the Korean Physical Society

Volumn 35, Issue SUPPL. 2, 1999, Pages

  Baek, Jong Sung ^a   Kim, Chong Oh ^a   Lee, Soo Hyung ^b   Lim, Woo Young ^c  

^a Chungnam National University   (South Korea)

^b Chongju University   (South Korea)

^c Korea University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033470058     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (11)

1. J. J. Krebs, D. M. Lind and S. D. Berry, J. Appl. Phys. 73(10), 6457 (1993).
2. J. F. Cochran, J. Rudd, W. B. Muir and Z. Celinski, Phys. Rev. B42, 508 (1990).
3. P. Chubing, D. Chen and D. Daosheng, Solid State Comm. 87(2), 161 (1993).
4. C. Kittel, Phys. Rev., 73, 155 (1948).
5. M. H. Seavey and P. E. Tannenwald, Phys. Rev. Lett. 1, 168 (1958).
6. R. F. Soohoo, Phys. Rev. 131(2), 594 (1963).
7. A. M. Portis, Appl. Phys. Lett. 2(4), 69 (1963).
8. P. E. Wigen, C. F. Kooi and M. R. Shanabarger, Phys. Rev. Lett. 9(5), 206 (1962).
9. G. T. Rado and J. R. Weertman, J. Phys. Chem. Solids 11, 315 (1959).
10. Y. Y. Kim, J. S. Beak, S. J. Lee, W. Y. Lim, S. C. Yu and S. H. Lee, J. Korean Phys. Soc. 31(3), 495 (1997).
11. W. Y. Lim, J. S. Beak, Y. Y. Kim, S. J. Lee, S. C. Yu and S. H. Lee, Electron Technology 31(1), 60 (1998).