Tomographic atom probe: New dimension in materials analysis

Microscopy and Microanalysis

Volumn 5, Issue 1, 1999, Pages 39-47

  Deconihout, B ^a   Pareige, C ^a   Pareige, P ^a   Blavette, D ^a   Menand, A ^a  

^a UNIVERSITÉ ET INSA DE ROUEN   (France)

Author keywords

Atom probe; Atomic scale imaging; Copper; Nanoanalysis; Position sensitive detector

Indexed keywords

EID: 0033467003     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927699000033     Document Type: Article

References (25)

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