Thermal expansion and electrical resistivity of EuNi2(Si1-xGex)2

Journal of the Physical Society of Japan

Volumn 68, Issue 3, 1999, Pages 950-953

  Wada, Hirofumi ^a   Sakata, Tomonori ^a   Nakamura, Akihiro ^a   Mitsuda, Akihiro ^a   Shiga, Masayuki ^a   Ikeda, Yasunori ^a   Bando, Yoshichika ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

Electrical resistivity; EuNi2(Si1 xGex)2; First order phase transition; Intermediate valence; Thermal expansion

Indexed keywords

EID: 0033466465     PISSN: 00319015     EISSN: None     Source Type: Journal    
DOI: 10.1143/JPSJ.68.950     Document Type: Article

References (12)

1. I. Felner and I. Nowik: J. Phys. Chem. Solids 39 (1977) 763.
2. G. Wortmann, I. Nowik, B. Perscheid, G. Kaindl and I. Felner: Phys. Rev. B 43 (1991) 5261.
3. H. Wada, A. Nakamura, A. Mitsuda, M. Shiga, T. Tanaka, H. Mitamura and T. Goto: J. Phys.: Condens. Matter 9 (1997) 7913.
4. L. C. Gupta, V. Murgai, Y. Yeshurun and R. D. Parks: Valence Instabilities, ed. P. Wachter and H. Boppart (North Holland, Amsterdam, 1982) p. 225.
5. S. Patil, R. Nagarajan, L. C. Gupta, B. D. Padalia and R. Vijayaraghavan: Solid State Commun. 76 (1990) 1173.
6. H.-J. Hesse, R. Lübbers, M. Winzenick, H. W. Neuling and G. Wortmann: J. Alloys Compounds 246 (1997) 220.
7. C. U. Segre, M. Croft, J. A. Hodges, V. Murgai, L. C. Gupta and R. D. Parks: Phys. Rev. Lett. 49 (1982) 1947.
8. E. V. Sampathkumaran, R. Vijayaraghavan, K. V. Gopalakrishnan, R. G. Pilley and H. G. Devare: Valence Fluctuations in Solids, ed. L. M. Falikov, W. Hanke and M. B. Maple (North Holland, Amsterdam, 1981) p. 193.
9. A. Mitsuda, H. Wada, M. Shiga, H. Aruga Katori and T. Goto: Phys. Rev. B 55 (1997) 12474.
10. Ch. Sauer, G. Galinski, W. Zinn and M. M. Abd-Elmeguid: Solid State Commun. 62 (1987) 265.
11. D. Wohlleben and B. Wittershagen: Adv. Phys. 34 (1985) 403.
12. H. Wada, M. F. Hundley, R. Movshovich and J. D. Thompson: Phys. Rev. B 59 (1999) 1141.