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Volumn 28, Issue 5, 1999, Pages 335-338
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Multi-element analysis of fine roots of Scots pine by total reflection x-ray fluorescence spectrometry
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Author keywords
[No Author keywords available]
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Indexed keywords
ABSORPTION SPECTROSCOPY;
ATMOSPHERIC PRESSURE;
ATOMIC ABSORPTION SPECTROMETRY;
FLUORESCENCE;
FLUORESCENCE SPECTROSCOPY;
TRACE ELEMENTS;
FINE ROOTS;
GRAPHITE FURNACE ATOMIC ABSORPTION SPECTROMETRY;
GRAPHITE FURNACE-ATOMIC ABSORPTION SPECTROMETRIES;
MULTIELEMENT ANALYSIS;
ROOT SAMPLES;
SCOTS PINE;
TOTAL REFLECTION X-RAY FLUORESCENCE;
TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETRIES;
TRACE ELEMENTS CONCENTRATION;
X-RAY FLUORESCENCE MEASUREMENT;
QUALITY CONTROL;
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EID: 0033459107
PISSN: 00498246
EISSN: None
Source Type: Journal
DOI: 10.1002/(SICI)1097-4539(199909/10)28:5<335::AID-XRS361>3.0.CO;2-8 Document Type: Article |
Times cited : (13)
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References (11)
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