Spectro-ellipsometric studies of sputtered amorphous titanium dioxide thin films: Simultaneous determination of refractive index, extinction coefficient, and void distribution

Journal of the Korean Physical Society

Volumn 34, Issue 3, 1999, Pages 319-322

  Lee, Soonil ^a   Rhee, Sung Gyu ^a   Oh, Soo Ghee ^a  

^a Ajou University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033453111     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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