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Volumn 14, Issue 2, 1999, Pages 130-132

Powder diffraction data and Rietveld refinement of Hägg-carbide, X-Fe5C2

Author keywords

H gg carbide; Powder data; Rietveld refinement; Structure

Indexed keywords

CARBIDES; CRYSTAL STRUCTURE; RIETVELD ANALYSIS; STRUCTURE (COMPOSITION); SYSTEMATIC ERRORS;

EID: 0033445506     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1017/s0885715600010435     Document Type: Article
Times cited : (81)

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  • 4
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    • Pulverphotogramme eines neuen Eisencarbides
    • Hägg, G. (1934). "Pulverphotogramme eines neuen Eisencarbides," Z Kristallogr. 89, 92-94.
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  • 5
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    • A silicon powder diffraction standard reference material
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    • N: A criterion for rating powder diffraction patterns and evaluating the reliability of powder-pattern indexing
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    • Smith, G.J.1    Snyder, R.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.