Growth of Ni films observed by scanning tunneling microscopy and X-ray

Chinese Physics Letters

Volumn 16, Issue 5, 1999, Pages 370-372

  Wang, De Liang ^a,b   Geyer, U ^b  

^a INSTITUTE OF PHYSICS   (China)

^b UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT SCATTERING; SAPPHIRE; X RAY DIFFRACTION;

CONSTANT VALUES; FILM PLANES; FILM-THICKNESS; GRAINSIZE; LATERAL DIMENSION; LINEAR DIMENSIONS; NI FILMS; SAPPHIRE SUBSTRATES; SCATTERING REGIONS;

SCANNING TUNNELING MICROSCOPY;

EID: 0033444171     PISSN: 0256307X     EISSN: None     Source Type: Journal    
DOI: 10.1088/0256-307X/16/5/021     Document Type: Article

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