High-resolution X-ray spectroscopy with superconducting tunnel junctions

X-Ray Spectrometry

Volumn 28, Issue 5, 1999, Pages 309-311

  Hettl, P ^a   Angloher, G ^a   Feilitzsch, F V ^a   Hohne J ^a   Jochum, J ^a   Kraus, H ^b   Mossbauer R L ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; X RAY DETECTORS; X RAY SPECTROSCOPY;

ALUMINUM FILM; ELECTRONIC NOISE; ENERGY RESOLUTIONS; HIGH QUALITY; HIGH RESOLUTION X RAY SPECTROSCOPY; KΑ; NOISE CONTRIBUTIONS; SLIT MASK; SUPERCONDUCTING TUNNEL JUNCTION; TUNNEL BARRIER;

TUNNEL JUNCTIONS;

EID: 0033443213     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4539(199909/10)28:5<309::AID-XRS341>3.0.CO;2-1     Document Type: Article

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