Sensitivity and Stability of the Classifications of Returns to Scale in Data Envelopment Analysis

Journal of Productivity Analysis

Volumn 12, Issue 1, 1999, Pages 55-75

  Seiford, Lawrence M ^a   Zhu, Joe ^b  

^a University of Massachusetts   (United States)

^b WORCESTER POLYTECHNIC INSTITUTE   (United States)

Author keywords

Data envelopment analysis (DEA); Returns to scale (RTS); Sensitivity; Stability

Indexed keywords

EID: 0033441488     PISSN: 0895562X     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1007803207538     Document Type: Article

References (23)

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