메뉴 건너뛰기




Volumn 68, Issue 1, 1999, Pages 166-169

Electronic structure of BP studied by resonant soft X-ray emission spectroscopy

Author keywords

III V semiconductor; X ray absorption; X ray emission

Indexed keywords


EID: 0033438180     PISSN: 00319015     EISSN: None     Source Type: Journal    
DOI: 10.1143/JPSJ.68.166     Document Type: Article
Times cited : (16)

References (23)
  • 1
    • 85034143445 scopus 로고    scopus 로고
    • Special issue Resonant Inelastic Soft X-ray Scattering (RIXS)
    • See, for example, Appli. Phys. A 65 (1997), Special issue Resonant Inelastic Soft X-ray Scattering (RIXS).
    • (1997) Appli. Phys. A , vol.65
  • 22
    • 85034143479 scopus 로고    scopus 로고
    • unpublished
    • A. Agui et al.: unpublished.
    • Agui, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.