Application of Auxiliary Signals in X-Ray Fluorescence and Electron Microprobe Analysis for Density Evaluation

X-Ray Spectrometry

Volumn 28, Issue 4, 1999, Pages 282-291

  Kuczumow, A ^a,b   Vekemans, B ^a   Schalm, O ^a   Vincze, L ^a   Dorrine W ^a   Gysels, K ^a   Van Grieken, R ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b MARIA CURIE SK ODOWSKA UNIVERSITY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CELLULOSE; ELECTRON PROBE MICROANALYSIS; FLUORESCENCE; SECONDARY EMISSION; SILICA; SYNCHROTRON RADIATION; SYNCHROTRONS; WOOD;

AUXILIARY SIGNALS; DENSITY EVALUATION; ELECTRON-MICROPROBE ANALYSIS; FLUORESCENCE MICROPROBE; PETRIFIED WOOD; SCATTERED SIGNALS; SECONDARY ELECTRONS; SIGNAL BEAMS; X RAY FLUORESCENCE; X RAY FLUORESCENCE ANALYSIS;

ELECTRONS;

EID: 0033425996     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4539(199907/08)28:4<282::AID-XRS352>3.0.CO;2-H     Document Type: Article

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