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Volumn 14, Issue 2, 1999, Pages 133-135

Crystal structure of 3-methoxybenzanthrone from X-ray powder diffraction

Author keywords

Rietveld refinement; Structure determination; X ray diffraction

Indexed keywords

RIETVELD REFINEMENT; X RAY DIFFRACTION; X RAY POWDER DIFFRACTION;

EID: 0033417924     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1017/S0885715600010447     Document Type: Article
Times cited : (6)

References (11)
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  • 2
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  • 3
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    • A grid search procedure of positioning a known molecule in an unknown crystal structure with the use of powder diffraction data
    • Chernyshev, V. V. and Schenk, H. (1998). "A grid search procedure of positioning a known molecule in an unknown crystal structure with the use of powder diffraction data," Z. Kristallogr. 213, 1-3.
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  • 4
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    • Correction of intensities for preferred orientation in powder diffractometry: Application of the march model
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  • 8
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    • Whole-powder-pattern fitting without reference to a structural model: Application to X-ray powder diffractometer data
    • Toraya, H. (1986). "Whole-powder-pattern fitting without reference to a structural model: application to X-ray powder diffractometer data," J. Appl. Crystallogr. 19, 440-447.
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  • 9
    • 0001026305 scopus 로고
    • Profile shape functions in Rietveld refinements
    • Young, R. A. and Wiles, D. B. (1982). "Profile shape functions in Rietveld refinements," J. Appl. Crystallogr. 15, 430-438.
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  • 10
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    • MRIA - A program for a full profile analysis of powder multiphase neutron-diffraction time-of-flight (direct and Fourier) spectra
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.