X-ray powder diffraction with hybrid semiconductor pixel detectors

Journal of Synchrotron Radiation

Volumn 6, Issue 2, 1999, Pages 112-115

  Manolopoulos, S ^a   Bates, R ^a   Bushnell Wye, G ^b   Campbell, M ^c   Derbyshire, G ^d   Farrow, R ^b   Heijne, E ^c   O'Shea, V ^a   Raine, C ^a   Smith, K M ^a  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

^b DARESBURY LABORATORY   (United Kingdom)

^c CERN   (Switzerland)

^d RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

Photon counting; Semiconductor pixel detectors; X ray diffraction imaging

Indexed keywords

EID: 0033409067     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049599001107     Document Type: Article

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