Characterization of controlled microstructures in a γ-TiAl(Cr, Mo, Si, B) alloy

Intermetallics

Volumn 7, Issue 10, 1999, Pages 1081-1087

  Zhang, D ^a   Arzt, E ^a   Clemens, H ^b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; GRAIN SIZE AND SHAPE; HEAT TREATMENT; METAL CASTING; METAL EXTRUSION; METALLOGRAPHIC MICROSTRUCTURE; OPTICAL MICROSCOPY; PHASE TRANSITIONS; SCANNING ELECTRON MICROSCOPY; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

HOT EXTRUSION; LAMELLAR MICROSTRUCTURE; LAMELLAR SPACING;

TITANIUM ALLOYS;

EID: 0033365503     PISSN: 09669795     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0966-9795(99)00036-9     Document Type: Article

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