Ionization-excitation of He following electron and proton impact: A polarization study using an EUV polarimeter

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3764, Issue , 1999, Pages 2-12

  Merabet, H ^a   Siems, A ^a   Bruch, R ^a   Fulling, S ^a   Bailey, M ^a  

^a UNIVERSITY OF NEVADA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON OPTICS; HELIUM; HIGH ENERGY PHYSICS; IONIZATION OF GASES; LIGHT POLARIZATION; LIGHT REFLECTION; MIRRORS; OPTICAL MULTILAYERS; PLASMA DIAGNOSTICS; PROTONS;

ELECTRON IMPACT; PROTON IMPACT;

POLARIMETERS;

EID: 0033364836     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)