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Volumn 3767, Issue , 1999, Pages 238-241
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Development of soft X-ray multilayer mirrors for a wavelength of 3 nm
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Author keywords
[No Author keywords available]
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Indexed keywords
CHROMIUM;
ELECTROMAGNETIC WAVE REFLECTION;
ION BEAMS;
ION BOMBARDMENT;
OPTICAL MULTILAYERS;
SCANDIUM;
SPUTTER DEPOSITION;
X RAY ANALYSIS;
SOFT X RAY MULTILAYER MIRRORS;
MIRRORS;
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EID: 0033364747
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (21)
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References (5)
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