Testing methodology for FireWire

IEEE Design and Test of Computers

Volumn 16, Issue 3, 1999, Pages 102-111

  Melatti, Lee ^a   Blancha, Barry ^b  

^a Advantest America Inc   (United States)

^b TMT Inc

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATED TEST EQUIPMENT; DEVICE UNDER TEST; FIREWIRE; SERIAL PHYSICAL INTERFACE; VLSI LOGIC TEST SYSTEM;

AUTOMATIC TESTING; COMPARATOR CIRCUITS; ELECTRIC IMPEDANCE; ELECTRIC LINES; ELECTRIC POTENTIAL; EQUIPMENT TESTING; INTEGRATED CIRCUIT TESTING; PHASE LOCKED LOOPS; VLSI CIRCUITS;

USER INTERFACES;

EID: 0033364170     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.785844     Document Type: Article

References (0)