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Volumn 2, Issue , 1999, Pages 423-426
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Noise characterization of MOSFET's for RF oscillator design
a
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Author keywords
[No Author keywords available]
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Indexed keywords
BIPOLAR TRANSISTORS;
CURRENT DENSITY;
ELECTRIC INDUCTORS;
MOS CAPACITORS;
NATURAL FREQUENCIES;
OSCILLATORS (ELECTRONIC);
PHASE MEASUREMENT;
SEMICONDUCTOR DEVICE MODELS;
SPECTRUM ANALYSIS;
SPURIOUS SIGNAL NOISE;
DIRECT PARAMETER EXTRACTION METHOD;
INDUCTOR FREE BIASING CIRCUIT;
NOISE CURRENT SPECTRUM DENSITY;
NOISE MODEL;
THICKER NOISE EQUATIONS;
MOSFET DEVICES;
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EID: 0033363811
PISSN: 0149645X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (7)
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References (4)
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