New structure for a six-port reflectometer using a silicon MOSFET for power measurement

IEEE MTT-S International Microwave Symposium Digest

Volumn 4, Issue , 1999, Pages 1647-1650

  Ratni, Mohamed ^a   Huyart, Bernard ^a   Bergeault, Eric ^a   Jallet, Louis ^a  

^a TELECOM PARISTECH   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; ELECTRIC NETWORK ANALYZERS; ELECTRIC POWER MEASUREMENT; MOSFET DEVICES; REFLECTOMETERS; SCHOTTKY BARRIER DIODES; SEMICONDUCTING SILICON; SENSITIVITY ANALYSIS;

POWER DETECTOR; REFLECTION COEFFICIENT;

MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;

EID: 0033363806     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)