Measurement of critical phenomena by multiangle light scattering

American Laboratory

Volumn 31, Issue 16, 1999, Pages

  Trainoff, Steven P ^a   Chen, Michelle H ^a   Wiener, Michael C ^a  

^a Wyatt Technology Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURVE FITTING; PHASE SEPARATION; STATISTICAL MECHANICS; SURFACE ACTIVE AGENTS; WATER;

ISING EXPONENTS; MULTIANGLE LIGHT SCATTERING; RENORMALIZATION GROUP THEORY;

BINARY MIXTURES;

EID: 0033363705     PISSN: 00447749     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (6)