메뉴 건너뛰기




Volumn 146, Issue 9, 1999, Pages 3415-3419

SiO2 films from tetraethoxysilane-based LPCVD: An experimental investigation of the by-product-inhibited deposition mechanism

Author keywords

[No Author keywords available]

Indexed keywords

BYPRODUCTS; CHEMICAL VAPOR DEPOSITION; ETHANOL; INITIATORS (CHEMICAL); REACTION KINETICS; SEMICONDUCTING SILICON COMPOUNDS; SILANES; SILICA;

EID: 0033362957     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1392488     Document Type: Article
Times cited : (10)

References (11)
  • 11
    • 0000543530 scopus 로고    scopus 로고
    • Chemical vapor deposition
    • M. D. Allendorf and C. Bernard, Editors, PV 97-25, Pennington, NJ
    • J. Arndt and G. Wahl, in Chemical Vapor Deposition, M. D. Allendorf and C. Bernard, Editors, PV 97-25, p. 147, The Electrochemical Society Proceedings Series, Pennington, NJ (1997).
    • (1997) The Electrochemical Society Proceedings Series , pp. 147
    • Arndt, J.1    Wahl, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.