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Volumn 146, Issue 9, 1999, Pages 3415-3419
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SiO2 films from tetraethoxysilane-based LPCVD: An experimental investigation of the by-product-inhibited deposition mechanism
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Author keywords
[No Author keywords available]
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Indexed keywords
BYPRODUCTS;
CHEMICAL VAPOR DEPOSITION;
ETHANOL;
INITIATORS (CHEMICAL);
REACTION KINETICS;
SEMICONDUCTING SILICON COMPOUNDS;
SILANES;
SILICA;
LOW-PRESSURE CHEMICAL VAPOR DEPOSITION (LPCVD);
TETRAETHOXYSILANE;
SEMICONDUCTING FILMS;
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EID: 0033362957
PISSN: 00134651
EISSN: None
Source Type: Journal
DOI: 10.1149/1.1392488 Document Type: Article |
Times cited : (10)
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References (11)
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