Raman scattering from BaTiO3 thin film prepared on silicon substrate by r.f. sputtering

Thin Solid Films

Volumn 354, Issue 1, 1999, Pages 262-266

  Wang, B ^a   Zhang, L D ^a   Zhang, L ^b   Yan, Y ^b   Zhang, S L ^b  

^a INSTITUTE OF SOLID STATE PHYSICS   (China)

^b PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM TITANATE; CERAMIC MATERIALS; CRYSTALLINE MATERIALS; FERROELECTRIC MATERIALS; MAGNETRON SPUTTERING; PHASE TRANSITIONS; RAMAN SPECTROSCOPY; SILICON; STRESS ANALYSIS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

TETRAGONAL BANDS;

DIELECTRIC FILMS;

EID: 0033362862     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00432-0     Document Type: Article

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